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AFM submicron calibration (278nm)
Calibration grating for SPM and STM submicron calibration in X or Y direction.
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Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction. |
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Diffraction grating TDG01_Au is intended for submicron calibration scanning tunneling microscopes (STM) in the X or Y direction. |
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